

This configuration sets the sample to be imaged on a special sample mount such that the STEM detector, which is mounted on a long rod that extends out of the side of the sample chamber, can align to the underside of the sample. Our Scanning Electron Microscope has an optional accessory that enables the system to produce Scanning Transmission Electron Microscope (STEM) images. Scanning Transmission Electron Microscope System Included at the end of each section is a skeletal outline of procedural steps so the newly trained operator can follow the order of operation without having to read the in-depth explanations during real time use.Įlectron Back Scatter Diffraction Detector In general the material presented here informs the reader about how the tool works in the order that an operator would proceed in using the tool.
ELECTRON AUTO MOUSE CLICK MANUAL
This is a step-by-step operation manual written for the Zeiss Supra-40 Scanning Electron Microscope at the University of Texas at Dallas Cleanroom, including the numerous optional subsystems mounted on this tool.

Electron Back Scatter Diffraction Detector.
